Cross-sectional IR PiFM Analysis

Multi-layers of different materials find usage across various applications. The thicknesses of the layers range from nanometers to millimeters. Various analytical and microscopy techniques are utilized to study the interfaces of the layers by preparing cross-sections of the samples. 

To identify the layers or to study the chemical nature of the interfaces, Raman spectroscopy or infrared (absorption) spectroscopy can be used if the layers are thick enough (millimeters for practical purposes). For layers that are sub-micron in thickness, there currently is no viable technique to chemically identify the layers and analyze the interface between the different layers.  IR PiFM with ~5 nm spatial resolution in IR spectral analysis is well suited for such applications.