The Vista 300 is the most advanced nano-chemical metrology instrument for wafers up to 300 mm! With sub-5 nm IR spatial resolution and single-molecule-level sensitivity, the instrument can help you efficiently solve tough problems for R&D and failure analysis in nanofabrication!
Key Features and Benefits
♦ Exceptional AFM performance
♦ Automatic alignment
♦ Ultimate spectro-nanoscopy
Applications
♦ Nanoscale infrared imaging of zeolites using photoinduced force
microscopy
♦ A low cost and high performance polymer donor material for
polymer solar cells
♦ Photoinduced force mapping of plasmonic nanostructures
About Molecular Vista
Molecular Vista designs, develops, and provides tools that allow its customers to probe and understand matter at the molecular level through quantitative visualization. Molecular Vista was founded by two industry veterans, Prof. Kumar Wickramasinghe (UC Irvine and formerly with IBM Research) and Dr. Sung Park (co-founder of Park Scientific Instruments).
Why Molecular Vista?
♦ Patented photo-induced force microscopy
♦ technique
♦ AFM-IR with the highest spatial resolution
♦ hyPIR™ Imaging
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