The NX9000 is a processing and observation system for three-dimensional analysis, with an FIB and SEM arranged perpendicular to each other. Optimal positioning of the FIB-SEM columns and detection systems allows high-resolution, three-dimensional, multi-analysis. The NX9000 features the highest precision in material processing for a wide range of areas relating to advanced materials, electronic devices, biological tissues and many more.
Key Features and Benefits
♦ Optimized for 3D structural analysis
♦ Supports analysis for a wide range of materials
♦ High-quality sample preparation for TEM and atom-probe applications
Applications
♦ Biological tissues
♦ Advanced materials
♦ Semiconductor devices
About Hitachi
Hitachi High-Tech Corporation, provides a wide variety of scientific instruments. Their innovative R&D approach enables them to provide world-class solutions in the fields of materials sciences, life sciences, energy storage and semiconductor.
Why Hitachi?
♦ Key player in the market of Electron Microscopes
♦ Creative, leading-edge technology
♦ Complementary product range
Related products
With a high-sensitivity low-vacuum SE detector
SU3800 SE/SE Plus – SU3900 SE/ SE Plus
SE Series offering a combination of high performance and versatility
Compact variable-pressure SEM with unparalleled image resolution