The SU3800SE/ SE Plus – SU3900SE/ SE Plus Scanning Electron Microscopes are FE-SEMs that offer high-resolution observation capabilities. They combine easy data acquisition through simple operation with much larger and heavier specimens than existing FE-SEMs. This makes it possible to observe large and heavy specimens including industrial materials such as iron and steel, automotive parts, and aerospace-related parts.
♦ Schottky SEM with large specimen chamber to expand application capabilities
♦ High resolution for improved top-surface imaging
♦ Automation and support functions that improve usability
♦ Metals
♦ Electronic components
♦ Inorganic Materials
Hitachi High-Tech Corporation, provides a wide variety of scientific instruments. Their innovative R&D approach enables them to provide world-class solutions in the fields of materials sciences, life sciences, energy storage and semiconductor.
♦ Key player in the market of Electron Microscopes
♦ Creative, leading-edge technology
♦ Complementary product range
VP-SEM with thermionic electron source/ VP-SEM with thermionic electron source and large sample chamber
Non-invasive measurement of micro- and nanogeometries with multiple optical technologies
Compact variable-pressure SEM with unparalleled image resolution