Groot-Ammers | October 14th, 2024

Throughout the on-line workshop, you’ll have the opportunity to hear from and engage with some of our PHI users, who will be presenting their experiences, insights, and solutions. Their unique perspectives will inspire new approaches to the challenges we all face in our work.

DATE & TIME
📆 Tuesday, November 12th, 2024
🕔 16:00 (CET) 

Speakers:

Olivier Heintz, University of Bourgogne, “XPS and TOF SIMS for materials analysis. Presentation of key results in the fields of Nanomedicine and Tribology.”

Cecile Courreges, CNRS, “TOF-SIMS at IPREM: from analysis of interfaces in batteries to the characterization of functionalized nanoparticles interacting with bacteria“

Edward Gillman, Naval Nuclear Laboratory, “Evidence of the localization of hydrogen and zirconium hydride in Zircaloy with Time-of-Flight Secondary Ion Mass Spectroscopy (TOF-SIMS)”

Jean-Paul Barnes, CEA Leti, “TOF-SIMS as part of the nano characterization tool box for semiconductor research and development and beyond.”