Groot-Ammers | September 17th, 2024

Modern surface analysis tools are typically multi-purpose instruments, equipped with a wide range of options enabling the measurement or characterization of many distinct surface properties. 

DATE & TIME
📆 Thursday, September 26th, 2024
🕔 17:00 (CET) 

For example, X-ray photoemission spectrometers (XPS) are often additionally equipped with instrumentation designed to measure the valence electronic structure.  These additional options enable scientists and engineers to acquire complementary information from samples at the same location without having to expose sensitive samples to the air, saving significant time and money over measurements acquired on separate tools. 

In Part 2 of this webinar series, James will continue the discussion of three of these techniques available on PHI XPS products:  Ultraviolet Photoemission Spectroscopy (UPS), Low Energy Inverse Photoemission Spectroscopy (LEIPS), and Reflection Electron Energy Loss Spectroscopy (REELS). UPS and LEIPS are powerful techniques for measuring the occupied valence and unoccupied conduction electronic bands of a material/surface, including beam-sensitive materials that can be damaged by other conventional methods. REELS, meanwhile, uses an electron beam to probe the optical excitations that can happen at a surface, and additionally is capable of measuring hydrogen content.